Semiconductor devices. Mechanical and climatic test methods - Particle impact noise detection (PIND)What is BS EN 60749 16 Particle impact noise detection about? BS EN 60749 16 is an international standard that focuses on the quality and performance of semiconductor devices and particle impact noise detection. BS EN 60749 16 serves the purpose to detect the presence of loose particles inside a cavity device such as chips of ceramic, pieces of bonding wire, or solder balls (prills). BS EN 60749 16 stipulates the technicalities such as related terms

Neither is it intended for use by the general engineering public

It applies to nuts:

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instruments and equipment for the measurement of power and energy of laser radiation

Note 5: IEC 60730-2-15  does not apply to air flow

and compatible with

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Annex B (informative) Results of an interlaboratory test

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Film thickness is the depth of the coating applied

BS 9751 also provides you with inspection requirements to verify the performance characteristics of inductors which ensures their reliability